Pascal Fornara

	2011
3		Y. Joly, L. Truphemus, Laurent Lopez, Jean Michel Portal, Hassen Aziza, F. Julien, Pascal Fornara: Temperature and hump effect impact on output voltage spread of low power bandgap designed in the sub-threshold area. ISCAS 2011: 2549-2552
2		Y. Joly, Laurent Lopez, Jean Michel Portal, Hassen Aziza, Jean-Luc Ogier, Y. Bert, F. Julien, Pascal Fornara: Matching degradation of threshold voltage and gate voltage of NMOSFET after Hot Carrier Injection stress. Microelectronics Reliability 51(9-11): 1561-1563 (2011)
	2009
1		Christelle Bénard, Gaëtan Math, Pascal Fornara, Jean-Luc Ogier, Didier Goguenheim: Influence of various process steps on the reliability of PMOSFETs submitted to negative bias temperature instabilities. Microelectronics Reliability 49(9-11): 1008-1012 (2009)

Coauthor Index

1	Hassen Aziza	[2] [3]
2	Christelle Bénard	[1]
3	Y. Bert	[2]
4	Didier Goguenheim (D. Goguenheim)	[1]
5	Y. Joly	[2] [3]
6	F. Julien	[2] [3]
7	Laurent Lopez	[2] [3]
8	Gaëtan Math	[1]
9	Jean-Luc Ogier	[1] [2]
10	Jean Michel Portal	[2] [3]
11	L. Truphemus	[3]

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