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Donato O. Forlenza Coauthor index pubzone.org

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7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJames Crafts, David Bogdan, Dennis Conti, Donato O. Forlenza, Orazio P. Forlenza, William V. Huott, Mary P. Kusko, Edward Seymour, Timothy Taylor, Brian Walsh: Testing the IBM Power 7™ 4 GHz eight core microprocessor. ITC 2010: 49-58
2009
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLFranco Stellari, Peilin Song, John Sylvestri, D. Miles, Orazio P. Forlenza, Donato O. Forlenza: On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC). ITC 2009: 1-10
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLG. Salem, D. W. Wittig, Thomas G. Foote, Bryan J. Robbins, C. Hirko, Donato O. Forlenza, Franco Motika, J. A. Kyle, Mary P. Kusko, Orazio P. Forlenza, R. J. Frishmuth, Rona Yaari, S. Michnowski, U. Baur: Structural and functional test of IBM System z10 chips. IBM Journal of Research and Development 53(1): 5 (2009)
1999
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPhil Nigh, David P. Vallett, Atul Patel, Jason Wright, Franco Motika, Donato O. Forlenza, Ray Kurtulik, Wendy Chong: Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. ITC 1999: 1152-1161
1997
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPhil Nigh, Donato O. Forlenza, Franco Motika: Application and Analysis of IDDQ Diagnostic Software. ITC 1997: 319-327
1990
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJ. Gartner, B. Driscoll, Donato O. Forlenza, Orazio P. Forlenza, Timothy J. Koprowski, T. Lizambri, R. Olsen, S. Robertson, P. Ryan, A. Walter: Weighted random test program generation for a per-pin tester. ITC 1990: 1000-1005
1985
1no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJohn A. Waicukauski, Eric Lindbloom, Edward B. Eichelberger, Donato O. Forlenza, Tim McCarthy: A Statistical Calculation of Fault Detection Probabilities By Fast Fault Simulation. ITC 1985: 779-784

Coauthor Index

1U. Baur [5]
2David Bogdan [7]
3Wendy Chong [4]
4Dennis Conti [7]
5James Crafts [7]
6B. Driscoll [2]
7Edward B. Eichelberger [1]
8Thomas G. Foote [5]
9Orazio P. Forlenza [2] [5] [6] [7]
10R. J. Frishmuth [5]
11J. Gartner [2]
12C. Hirko [5]
13William V. Huott (Bill Huott) [7]
14Timothy J. Koprowski [2]
15Ray Kurtulik [4]
16Mary P. Kusko [5] [7]
17J. A. Kyle [5]
18Eric Lindbloom [1]
19T. Lizambri [2]
20Tim McCarthy [1]
21S. Michnowski [5]
22D. Miles [6]
23Franco Motika [3] [4] [5]
24Phil Nigh [3] [4]
25R. Olsen [2]
26Atul Patel [4]
27Bryan J. Robbins [5]
28S. Robertson [2]
29P. Ryan [2]
30G. Salem [5]
31Edward Seymour [7]
32Peilin Song [6]
33Franco Stellari [6]
34John Sylvestri [6]
35Timothy Taylor [7]
36David P. Vallett [4]
37John A. Waicukauski [1]
38Brian Walsh [7]
39A. Walter [2]
40D. W. Wittig [5]
41Jason Wright [4]
42Rona Yaari [5]

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