F. Flourens

	2005
3		K. Yacine, F. Flourens, D. Bourrier, L. Salvagnac, P. Calmont, X. Lafontan, Q.-H. Duong, Lionel Buchaillot, D. Peyrou, Patrick Pons: Biaxial initial stress characterization of bilayer gold RF-switches. Microelectronics Reliability 45(9-11): 1776-1781 (2005)
2		Q.-H. Duong, Lionel Buchaillot, Dominique Collard, P. Schmitt, X. Lafontan, Patrick Pons, F. Flourens, F. Pressecq: Thermal and electrostatic reliability characterization in RF MEMS switches. Microelectronics Reliability 45(9-11): 1790-1793 (2005)
	2004
1		David Dubuc, M. Saddaoui, S. Mellé, F. Flourens, L. Rabbia, B. Ducarouge, K. Grenier, Patrick Pons, A. Boukabache, L. Bary: Smart MEMS concept for high secure RF and millimeterwave communications. Microelectronics Reliability 44(6): 899-907 (2004)

Coauthor Index

1	L. Bary	[1]
2	A. Boukabache	[1]
3	D. Bourrier	[3]
4	Lionel Buchaillot	[2] [3]
5	P. Calmont	[3]
6	Dominique Collard	[2]
7	David Dubuc	[1]
8	B. Ducarouge	[1]
9	Q.-H. Duong	[2] [3]
10	K. Grenier	[1]
11	X. Lafontan	[2] [3]
12	S. Mellé	[1]
13	D. Peyrou	[3]
14	Patrick Pons	[1] [2] [3]
15	F. Pressecq	[2]
16	L. Rabbia	[1]
17	M. Saddaoui	[1]
18	L. Salvagnac	[3]
19	P. Schmitt	[2]
20	K. Yacine	[3]

Last update Wed May 30 22:34:44 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page