D. Floriot

	2010
2		B. Lambert, G. Jonsson, J. Bataille, C. Ollivier, P. Mezenge, H. Derewonko, H. Thomas, D. Floriot, H. Blanck, C. Moreau: Reliability of high voltage/high power L/S-band Hbt technology. Microelectronics Reliability 50(9-11): 1543-1547 (2010)
	2001
1		Cezary Sydlo, Bastian Mottet, Husin Ganis, Hans L. Hartnagel, Viktor Krozer, S. L. Delage, Simone Cassette, Eric Chartier, D. Floriot, Steven Bland: Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT. Microelectronics Reliability 41(9-10): 1567-1571 (2001)

Coauthor Index

1	J. Bataille	[2]
2	H. Blanck	[2]
3	Steven Bland	[1]
4	Simone Cassette	[1]
5	Eric Chartier	[1]
6	S. L. Delage	[1]
7	H. Derewonko	[2]
8	Husin Ganis	[1]
9	Hans L. Hartnagel	[1]
10	G. Jonsson	[2]
11	Viktor Krozer	[1]
12	B. Lambert	[2]
13	P. Mezenge	[2]
14	C. Moreau	[2]
15	Bastian Mottet	[1]
16	C. Ollivier	[2]
17	Cezary Sydlo	[1]
18	H. Thomas	[2]

Colors in the list of coauthors

Last update Wed May 30 22:34:44 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page