T. S. Fisher

	2001
1		D. G. Walker, T. S. Fisher, J. Liu, Ronald D. Schrimpf: Thermal modeling of single event burnout failure in semiconductor power devices. Microelectronics Reliability 41(4): 571-578 (2001)

Coauthor Index

1	J. Liu	[1]
2	Ronald D. Schrimpf	[1]
3	D. G. Walker	[1]

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