María Fischerová

	2002
1		T. Cibáková, María Fischerová, Elena Gramatová, Wieslaw Kuzmicz, Witold A. Pleskacz, Jaan Raik, Raimund Ubar: Hierarchical test generation for combinational circuits with real defects coverage. Microelectronics Reliability 42(7): 1141-1149 (2002)

Coauthor Index

1	T. Cibáková	[1]
2	Elena Gramatová	[1]
3	Wieslaw Kuzmicz	[1]
4	Witold A. Pleskacz	[1]
5	Jaan Raik	[1]
6	Raimund Ubar	[1]

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