 | 2008 |
|---|
| 5 |       | M. Sienkiewicz,
Philippe Perdu,
Abdellatif Firiti,
Kevin Sanchez,
O. Crépel,
Dean Lewis:
Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs.
Microelectronics Reliability 48(8-9): 1529-1532 (2008) |
| 2007 |
|---|
| 4 | | C. Le Roux,
L. Lopez,
Abdellatif Firiti,
Jean-Luc Ogier,
F. Lalande,
R. Laffont,
G. Micolau:
A new method to quantify retention-failed cells of an EEPROM CAST.
Microelectronics Reliability 47(9-11): 1609-1613 (2007) |
| 2005 |
|---|
| 3 | | Abdellatif Firiti,
Felix Beaudoin,
G. Haller,
Philippe Perdu,
Dean Lewis,
Pascal Fouillat:
Impact of semiconductors material on IR Laser Stimulation signal.
Microelectronics Reliability 45(9-11): 1465-1470 (2005) |
| 2003 |
|---|
| 2 | | Abdellatif Firiti,
D. Faujour,
Gerald Haller,
J. M. Moragues,
Vincent Goubier,
Philippe Perdu,
Felix Beaudoin,
Dean Lewis:
Short defect characterization based on TCR parameter extraction.
Microelectronics Reliability 43(9-11): 1563-1568 (2003) |
| 1 | | Felix Beaudoin,
Romain Desplats,
Philippe Perdu,
Abdellatif Firiti,
G. Haller,
Vincent Pouget,
Dean Lewis:
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing.
Microelectronics Reliability 43(9-11): 1681-1686 (2003) |
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