Ken Filliter

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2002

2 Magnus Eckersand, Fredrik Franzon, Ken Filliter: Using At-Speed BIST to Test LVDS Serializer/Deserializer Function. J. Electronic Testing 18(2): 171-177 (2002)

2001

1 Stephen K. Sunter, Ken Filliter, Joe Woo, Pat McHugh: A general purpose 1149.4 IC with HF analog test capabilities. ITC 2001: 38-45

	2002
2		Magnus Eckersand, Fredrik Franzon, Ken Filliter: Using At-Speed BIST to Test LVDS Serializer/Deserializer Function. J. Electronic Testing 18(2): 171-177 (2002)
	2001
1		Stephen K. Sunter, Ken Filliter, Joe Woo, Pat McHugh: A general purpose 1149.4 IC with HF analog test capabilities. ITC 2001: 38-45

Coauthor Index

Last update Wed May 30 22:34:44 2012 CET by the DBLP Team —

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1	Magnus Eckersand	[2]
2	Fredrik Franzon	[2]
3	Pat McHugh	[1]
4	Stephen K. Sunter (Steve Sunter)	[1]
5	Joe Woo	[1]