Tim Figal

	2002
1		Minh Quach, Tuan Pham, Tim Figal, Bob Kopitzke, Pete O'Neill: Wafer-Level Defect-Based Testing Using Enhanced Voltage Stress and Statistical Test Data Evaluation. ITC 2002: 683-692

Coauthor Index

1	Bob Kopitzke	[1]
2	Pete O'Neill	[1]
3	Tuan Pham	[1]
4	Minh Quach	[1]

Last update Wed May 30 22:34:44 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page