 | 1992 |
|---|
| 4 |       | Matthew L. Fichtenbaum,
Robert J. Muller:
A VXI Driver-Sensor Instrument with Large Tester Architecture.
ITC 1992: 76-83 |
| 1991 |
|---|
| 3 | | Matthew L. Fichtenbaum,
Gordon D. Robinson:
Scan test architectures for digital board testers.
J. Electronic Testing 2(1): 99-105 (1991) |
| 1990 |
|---|
| 2 | | Matthew L. Fichtenbaum,
Gordon D. Robinson:
Scan test architectures for digital board testers.
ITC 1990: 304-310 |
| 1982 |
|---|
| 1 |  | Matthew L. Fichtenbaum:
Faults Which Challenge the In-Circuit Tester: Some Examples and Some Solutions.
ITC 1982: 530-536 |
Data released under the ODC-BY 1.0 license — See also our legal information page