 | 2010 |
|---|
| 8 |       | Imad A. Ferzli,
Eli Chiprout,
Farid N. Najm:
Verification and Codesign of the Package and Die Power Delivery System Using Wavelets.
IEEE Trans. on CAD of Integrated Circuits and Systems 29(1): 92-102 (2010) |
| 2007 |
|---|
| 7 | | Imad A. Ferzli,
Farid N. Najm,
Lars Kruse:
A geometric approach for early power grid verification using current constraints.
ICCAD 2007: 40-47 |
| 6 | | Imad A. Ferzli,
Farid N. Najm,
Lars Kruse:
Early power grid verification under circuit current uncertainties.
ISLPED 2007: 116-121 |
| 5 | | Farid N. Najm,
Noel Menezes,
Imad A. Ferzli:
A Yield Model for Integrated Circuits and its Application to Statistical Timing Analysis.
IEEE Trans. on CAD of Integrated Circuits and Systems 26(3): 574-591 (2007) |
| 2006 |
|---|
| 4 | | Imad A. Ferzli,
Farid N. Najm:
Analysis and verification of power grids considering process-induced leakage-current variations.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(1): 126-143 (2006) |
| 2005 |
|---|
| 3 |  | Dionysios Kouroussis,
Imad A. Ferzli,
Farid N. Najm:
Incremental partitioning-based vectorless power grid verification.
ICCAD 2005: 358-364 |
| 2003 |
|---|
| 2 | | Imad A. Ferzli,
Farid N. Najm:
Statistical estimation of leakage-induced power grid voltage drop considering within-die process variations.
DAC 2003: 856-859 |
| 1 | | Imad A. Ferzli,
Farid N. Najm:
Statistical Verification of Power Grids Considering Process-Induced Leakage Current Variations.
ICCAD 2003: 770-777 |
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