Antoni Ferré

	2002
5		Antoni Ferré, Joan Figueras: Leakage power bounds in CMOS digital technologies. IEEE Trans. on CAD of Integrated Circuits and Systems 21(6): 731-738 (2002)
	2001
4		Antoni Ferré, Joan Figueras: LEAP: An Accurate Defect-Free IDDQ Estimator. J. Electronic Testing 17(3-4): 267-274 (2001)
	1998
3		Antoni Ferré, Eugeni Isern, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras: IDDQ testing: state of the art and future trends. Integration 26(1-2): 167-196 (1998)
	1997
2		Antoni Ferré, Joan Figueras: IDDQ Characterization in Submicron CMOS. ITC 1997: 136-145
	1996
1		Antoni Ferré, Joan Figueras: On estimating bounds of the quiescent current for I/sub DDQ/ testin. VTS 1996: 106-111

Coauthor Index

1	Joan Figueras	[1] [2] [3] [4] [5]
2	Eugeni Isern	[3]
3	Rosa Rodríguez-Montañés	[3]
4	Josep Rius Vázquez (Josep Rius)	[3]

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