 | 2012 |
|---|
| 5 |       | D. Álvarez,
R. Fernández,
L. Sánchez:
Stroke Based Handwritten Character Recognition.
HAIS (1) 2012: 343-351 |
| 2009 |
|---|
| 4 | | R. Fernández:
A Modified Charge Pumping Method for Measuring Interface States Up to the Ghz Range.
J. Electronic Testing 25(4-5): 279-283 (2009) |
| 2007 |
|---|
| 3 | | R. Fernández,
R. Rodríguez,
M. Nafría,
X. Aymerich:
Effect of oxide breakdown on RS latches.
Microelectronics Reliability 47(4-5): 581-584 (2007) |
| 2006 |
|---|
| 2 | | R. Fernández,
R. Rodríguez,
M. Nafría,
X. Aymerich,
Ben Kaczer,
Guido Groeseneken:
FinFET and MOSFET preliminary comparison of gate oxide reliability.
Microelectronics Reliability 46(9-11): 1608-1611 (2006) |
| 2005 |
|---|
| 1 | | R. Fernández,
R. Rodríguez,
M. Nafría,
X. Aymerich:
Influence of oxide breakdown position and device aspect ratio on MOSFET's output characteristics.
Microelectronics Reliability 45(5-6): 861-864 (2005) |
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