D. Faure

	2005
4		F. Sibileau, C. Ali, C. Giret, D. Faure: SRAM cell defect isolation methodology by sub micron probing technique. Microelectronics Reliability 45(9-11): 1562-1567 (2005)
	2003
3		D. Faure, D. Bru, C. Ali, C. Giret, K. Christensen: Gate oxide breakdown characterization on 0.13mum CMOS technology. Microelectronics Reliability 43(9-11): 1519-1523 (2003)
	2002
2		C. Giret, D. Bru, D. Faure, C. Ali, M. Razani, D. Gobled: Electrical characteristics measurement of transistors by 4 tips-0.2 micron probing technique in Semiconductor Failure Analysis. Microelectronics Reliability 42(9-11): 1723-1727 (2002)
1		D. Faure, C. A. Waggoner: A New sub-micro probing technique for failure analysis in integrated circuits. Microelectronics Reliability 42(9-11): 1767-1770 (2002)

Coauthor Index

1	C. Ali	[2] [3] [4]
2	D. Bru	[2] [3]
3	K. Christensen	[3]
4	C. Giret	[2] [3] [4]
5	D. Gobled	[2]
6	M. Razani	[2]
7	F. Sibileau	[4]
8	C. A. Waggoner	[1]

Colors in the list of coauthors

Last update Tue May 29 20:41:18 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page