William D. Farwell

	1996
2		Piero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin Chu, Sanjay Wattal, Edward J. McCluskey, Robert L. Stokes, William D. Farwell: Analysis and Detection of Timing Failures in an Experimental Test Chip. ITC 1996: 691-700
	1995
1		Piero Franco, William D. Farwell, Robert L. Stokes, Edward J. McCluskey: An Experimental Chip to Evaluate Test Techniques: Chip and Experiment Design. ITC 1995: 653-662

Coauthor Index

1	Jonathan Chang	[2]
2	Yi-Chin Chu	[2]
3	Piero Franco	[1] [2]
4	Siyad C. Ma	[2]
5	Edward J. McCluskey	[1] [2]
6	Robert L. Stokes	[1] [2]
7	Sanjay Wattal	[2]

Last update Tue May 29 20:41:18 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page