N. Fard

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2007

1 Chenhua Li, N. Fard: Optimum Bivariate Step-Stress Accelerated Life Test for Censored Data. IEEE Transactions on Reliability 56(1): 77-84 (2007)

	2007
1		Chenhua Li, N. Fard: Optimum Bivariate Step-Stress Accelerated Life Test for Censored Data. IEEE Transactions on Reliability 56(1): 77-84 (2007)

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