 | 2012 |
|---|
| 9 |       | Hongxia Fang,
Krishnendu Chakrabarty,
Zhiyuan Wang,
Xinli Gu:
Reproduction and Detection of Board-Level Functional Failure.
IEEE Trans. on CAD of Integrated Circuits and Systems 31(4): 630-643 (2012) |
| 2011 |
|---|
| 8 | | Hongxia Fang,
Zhiyuan Wang,
Xinli Gu,
Krishnendu Chakrabarty:
Deterministic test for the reproduction and detection of board-level functional failures.
ASP-DAC 2011: 491-496 |
| 7 | | Hongxia Fang,
Zhiyuan Wang,
Xinli Gu,
Krishnendu Chakrabarty:
Ranking of Suspect Faulty Blocks Using Dataflow Analysis and Dempster-Shafer Theory for the Diagnosis of Board-Level Functional Failures.
European Test Symposium 2011: 195-200 |
| 2010 |
|---|
| 6 | | Hongxia Fang,
Zhiyuan Wang,
Xinli Gu,
Krishnendu Chakrabarty:
Mimicking of Functional State Space with Structural Tests for the Diagnosis of Board-Level Functional Failures.
Asian Test Symposium 2010: 421-428 |
| 5 | | Hongxia Fang,
Krishnendu Chakrabarty,
Hideo Fujiwara:
RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences.
J. Electronic Testing 26(2): 151-164 (2010) |
| 2009 |
|---|
| 4 | | Hongxia Fang,
Krishnendu Chakrabarty,
Rubin A. Parekhji:
Bit-Operation-Based Seed Augmentation for LFSR Reseeding with High Defect Coverage.
Asian Test Symposium 2009: 331-336 |
| 3 | | Hongxia Fang,
Krishnendu Chakrabarty,
Hideo Fujiwara:
RTL DFT techniques to enhance defect coverage for functional test sequences.
HLDVT 2009: 160-165 |
| 2 | | Hongxia Fang,
Krishnendu Chakrabarty,
Abhijit Jas,
Srinivas Patil,
Chandra Tirumurti:
RT-Level Deviation-Based Grading of Functional Test Sequences.
VTS 2009: 264-269 |
| 1 | | Zhanglei Wang,
Hongxia Fang,
Krishnendu Chakrabarty,
Michael Bienek:
Deviation-Based LFSR Reseeding for Test-Data Compression.
IEEE Trans. on CAD of Integrated Circuits and Systems 28(2): 259-271 (2009) |
Data released under the ODC-BY 1.0 license — See also our legal information page