D. D. Fan

	2009
1		W. K. Wong, C. W. M. Yuen, D. D. Fan, L. K. Chan, E. H. K. Fung: Stitching defect detection and classification using wavelet transform and BP neural network. Expert Syst. Appl. 36(2): 3845-3856 (2009)

Coauthor Index

1	L. K. Chan	[1]
2	E. H. K. Fung	[1]
3	W. K. Wong	[1]
4	C. W. M. Yuen	[1]

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