| | |
- CSB - MetaPress - Google - Bing - Yahoo
 | 2009 | |
|---|---|---|
| 3 |      | Chih-Min Fan, Yun-Pei Lu: A Bayesian Ranking Scheme for supporting cost-effective yield diagnosis services. CASE 2009: 427-432 |
| 2 | | Fang-Hsiang Su, Shi-Chung Chang, Chih-Min Fan, Ya-Jung Tsai, J. Jheng, Ching-Pin Kao, Chun-Yao Lu: A novel ontology-based knowledge engineering approach for yield symptom identification in semiconductor manufacturing. CASE 2009: 433-438 |
| 2008 | ||
| 1 | | Chih-Min Fan, Yun-Pei Lu: A Bayesian framework to integrate knowledge-based and data-driven inference tools for reliable yield diagnoses. Winter Simulation Conference 2008: 2323-2329 |
| 1 | Shi-Chung Chang | [2] |
| 2 | J. Jheng | [2] |
| 3 | Ching-Pin Kao | [2] |
| 4 | Chun-Yao Lu | [2] |
| 5 | Yun-Pei Lu | [1] [3] |
| 6 | Fang-Hsiang Su | [2] |
| 7 | Ya-Jung Tsai | [2] |
Colors in the list of coauthors
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