R. Falster

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2001

1 R. Falster, F. Bonoli, V. V. Voronkov: Dielectric breakdown distributions for void containing silicon substrates. Microelectronics Reliability 41(7): 967-971 (2001)

	2001
1		R. Falster, F. Bonoli, V. V. Voronkov: Dielectric breakdown distributions for void containing silicon substrates. Microelectronics Reliability 41(7): 967-971 (2001)

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