E. Falck

	2001
1		M. Zmeck, J. C. H. Phang, A. Bettiol, T. Osipowicz, F. Watt, L. J. Balk, F.-J. Niedernostheide, Hans-Joachim Schulze, E. Falck, R. Barthelmess: Analysis of high-power devices using proton beam induced charge microscopy. Microelectronics Reliability 41(9-10): 1519-1524 (2001)

Coauthor Index

1	L. J. Balk	[1]
2	R. Barthelmess	[1]
3	A. Bettiol	[1]
4	F.-J. Niedernostheide	[1]
5	T. Osipowicz	[1]
6	J. C. H. Phang	[1]
7	Hans-Joachim Schulze	[1]
8	F. Watt	[1]
9	M. Zmeck	[1]

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