M. Fadlallah

	2005
4		C. Petit, A. Meinertzhagen, D. Zander, O. Simonetti, M. Fadlallah, T. Maurel: Low voltage SILC and P- and N-MOSFET gate oxide reliability. Microelectronics Reliability 45(3-4): 479-485 (2005)
	2003
3		M. Fadlallah, C. Petit, A. Meinertzhagen, G. Ghibaudo, M. Bidaud, O. Simonetti, F. Guyader: Influence of nitradation in ultra-thin oxide on the gate current degradation of N and PMOS devices. Microelectronics Reliability 43(9-11): 1433-1438 (2003)
	2002
2		M. Fadlallah, G. Ghibaudo, Jalal Jomaah, M. Zoaeter, G. Guégan: Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs. Microelectronics Reliability 42(1): 41-46 (2002)
	2001
1		M. Fadlallah, A. Szewczyk, C. Giannakopoulos, B. Cretu, F. Monsieur, T. Devoivre, Jalal Jomaah, G. Ghibaudo: Low frequency noise and reliability properties pf 0.12 mum CMOS devices with Ta2O5 as gate dielectrics. Microelectronics Reliability 41(9-10): 1361-1366 (2001)

Coauthor Index

1	M. Bidaud	[3]
2	B. Cretu	[1]
3	T. Devoivre	[1]
4	Gérard Ghibaudo (G. Ghibaudo)	[1] [2] [3]
5	C. Giannakopoulos	[1]
6	G. Guégan	[2]
7	F. Guyader	[3]
8	Jalal Jomaah	[1] [2]
9	T. Maurel	[4]
10	A. Meinertzhagen	[3] [4]
11	F. Monsieur	[1]
12	C. Petit	[3] [4]
13	O. Simonetti	[3] [4]
14	A. Szewczyk	[1]
15	D. Zander	[4]
16	M. Zoaeter	[2]

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