 | 2009 |
|---|
| 4 |       | M. A. Exarchos,
G. J. Papaioannou,
Jalal Jomaah,
Francis Balestra:
Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs.
Microelectronics Reliability 49(9-11): 1018-1023 (2009) |
| 2008 |
|---|
| 3 | | Despina C. Moschou,
M. A. Exarchos,
Dimitrios N. Kouvatsos,
G. J. Papaioannou,
A. Arapoyanni,
Apostolos T. Voutsas:
Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique.
Microelectronics Reliability 48(8-9): 1544-1548 (2008) |
| 2007 |
|---|
| 2 | | Despina C. Moschou,
M. A. Exarchos,
Dimitrios N. Kouvatsos,
G. J. Papaioannou,
Apostolos T. Voutsas:
Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques.
Microelectronics Reliability 47(9-11): 1378-1383 (2007) |
| 2005 |
|---|
| 1 | | M. A. Exarchos,
G. J. Papaioannou,
Jalal Jomaah,
Francis Balestra:
The impact of static and dynamic degradation on SOI "smart-cut" floating body MOSFETs.
Microelectronics Reliability 45(9-11): 1386-1389 (2005) |
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