 | 2007 |
| 3 |  | L. Michalas,
M. Exarchos,
G. J. Papaioannou,
Dimitrios N. Kouvatsos,
Apostolos T. Voutsas:
An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors.
Microelectronics Reliability 47(12): 2058-2064 (2007) |
| 2006 |
| 2 |  | M. Exarchos,
E. Papandreou,
Patrick Pons,
M. Lamhamdi,
G. J. Papaioannou,
Robert Plana:
Charging of radiation induced defects in RF MEMS dielectric films.
Microelectronics Reliability 46(9-11): 1695-1699 (2006) |
| 2005 |
| 1 |  | M. Exarchos,
V. Theonas,
Patrick Pons,
G. J. Papaioannou,
S. Mellé,
David Dubuc,
Fabio Coccetti,
Robert Plana:
Investigation of charging mechanisms in metal-insulator-metal structures.
Microelectronics Reliability 45(9-11): 1782-1785 (2005) |