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| 2006 |
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N. Qu,
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Horst A. Gieser:
Study of CDM specific effects for a smart power input protection structure.
Microelectronics Reliability 46(5-6): 666-676 (2006) |
| 2005 |
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M. Graf,
Wolfgang Wilkening,
J. Willemen,
N. Qu,
S. Mettler,
M. Etherton:
Test circuits for fast and reliable assessment of CDM robustness of I/O stages.
Microelectronics Reliability 45(2): 269-277 (2005) |
| 1972 |
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Softw., Pract. Exper. 2(4): 359-375 (1972) |
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Chris J. Cheney,
M. Etherton,
Neil E. Wiseman:
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Data Structures for a Network Design System.
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