F. Essely

	2008
4		Aziz Machouat, G. Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, F. Essely: Effect of physical defect on shmoos in CMOS DSM technologies. Microelectronics Reliability 48(8-9): 1333-1338 (2008)
	2007
3		J. Adrian, N. Rodriguez, F. Essely, G. Haller, C. Grosjean, A. Portavoce, C. Girardeaux: Investigation of a new method for dopant characterization. Microelectronics Reliability 47(9-11): 1599-1603 (2007)
	2006
2		F. Essely, F. Darracq, Vincent Pouget, M. Remmach, Felix Beaudoin, N. Guitard, M. Bafleur, Philippe Perdu, André Touboul, Dean Lewis: Application of various optical techniques for ESD defect localization. Microelectronics Reliability 46(9-11): 1563-1568 (2006)
	2005
1		N. Guitard, F. Essely, D. Trémouilles, M. Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis: Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectronics Reliability 45(9-11): 1415-1420 (2005)

Coauthor Index

1	J. Adrian	[3]
2	M. Bafleur	[1] [2]
3	Felix Beaudoin	[2]
4	F. Darracq	[2]
5	Pascal Fouillat	[4]
6	C. Girardeaux	[3]
7	Vincent Goubier	[4]
8	C. Grosjean	[3]
9	N. Guitard	[1] [2]
10	Gerald Haller (G. Haller)	[3] [4]
11	Dean Lewis	[1] [2] [4]
12	Aziz Machouat	[4]
13	Nicolas Nolhier	[1]
14	Philippe Perdu	[1] [2] [4]
15	A. Portavoce	[3]
16	Vincent Pouget	[1] [2] [4]
17	M. Remmach	[2]
18	N. Rodriguez	[3]
19	André Touboul	[1] [2]
20	D. Trémouilles (David Trémouilles)	[1]

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