Kai Esmark

	2009
14		Adrien Ille, Wolfgang Stadler, Thomas Pompl, Harald Gossner, Tilo Brodbeck, Kai Esmark, Philipp Riess, David Alvarez, Kiran V. Chatty, Robert Gauthier, Alain Bravaix: Reliability aspects of gate oxide under ESD pulse stress. Microelectronics Reliability 49(12): 1407-1416 (2009)
13		David Alvarez, Kiran V. Chatty, Christian Russ, Michel J. Abou-Khalil, Junjun Li, Robert Gauthier, Kai Esmark, Ralph Halbach, Christopher Seguin: Design optimization of gate-silicided ESD NMOSFETs in a 45 nm bulk CMOS technology. Microelectronics Reliability 49(12): 1417-1423 (2009)
12		Michael Heer, Krzysztof Domanski, Kai Esmark, Ulrich Glaser, Dionyz Pogany, Erich Gornik, Wolfgang Stadler: Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology. Microelectronics Reliability 49(12): 1455-1464 (2009)
11		Tilo Brodbeck, Kai Esmark, Wolfgang Stadler: CDM tests on interface test chips for the verification of ESD protection concepts. Microelectronics Reliability 49(12): 1470-1475 (2009)
	2007
10		Ulrich Glaser, Kai Esmark, Martin Streibl, Christian Russ, Krzysztof Domanski, Mauro Ciappa, Wolfgang Fichtner: SCR operation mode of diode strings for ESD protection. Microelectronics Reliability 47(7): 1044-1053 (2007)
	2005
9		Wolfgang Stadler, Kai Esmark, K. Reynders, M. Zubeidat, M. Graf, Wolfgang Wilkening, J. Willemen, N. Qu, S. Mettler, M. Etherton: Test circuits for fast and reliable assessment of CDM robustness of I/O stages. Microelectronics Reliability 45(2): 269-277 (2005)
8		S. Bargstädt-Franke, Wolfgang Stadler, Kai Esmark, Martin Streibl, Krzysztof Domanski, Horst A. Gieser, Heinrich Wolf, W. Bala: Transient latch-up: experimental analysis and device simulation. Microelectronics Reliability 45(2): 297-304 (2005)
7		Martin Streibl, F. Zängl, Kai Esmark, Robert Schwencker, Wolfgang Stadler, Harald Gossner, S. Drüen, Doris Schmitt-Landsiedel: High abstraction level permutational ESD concept analysis. Microelectronics Reliability 45(2): 313-321 (2005)
	2003
6		Martin Streibl, Kai Esmark, A. Sieck, Wolfgang Stadler, M. Wendel, J. Szatkowski, Harald Gossner: Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies. Microelectronics Reliability 43(7): 1001-1010 (2003)
	2002
5		Wolfgang Stadler, Kai Esmark, Harald Gossner, Martin Streibl, M. Wendel, Wolfgang Fichtner, Dionyz Pogany, Martin Litzenberger, Erich Gornik: Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development. Microelectronics Reliability 42(9-11): 1267-1274 (2002)
4		F. Zängl, Harald Gossner, Kai Esmark, R. Owen, G. Zimmermann: Case study of a technology transfer causing ESD problems. Microelectronics Reliability 42(9-11): 1275-1280 (2002)
	2001
3		Kai Esmark, Wolfgang Stadler, M. Wendel, Harald Gossner, X. Guggenmos, Wolfgang Fichtner: Advanced 2D/3D ESD device simulation - a powerful tool already used in a pre-Si phase. Microelectronics Reliability 41(11): 1761-1770 (2001)
2		Harald Gossner, T. Müller-Lynch, Kai Esmark, Matthias Stecher: Wide range control of the sustaining voltage of electrostatic discharge protection elements realized in a smart power technology. Microelectronics Reliability 41(3): 385-393 (2001)
1		Martin Litzenberger, R. Pichler, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Kai Esmark, Harald Gossner: Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices. Microelectronics Reliability 41(9-10): 1385-1390 (2001)

Coauthor Index

1	Michel J. Abou-Khalil	[13]
2	David Alvarez	[13] [14]
3	W. Bala	[8]
4	S. Bargstädt-Franke	[8]
5	Alain Bravaix	[14]
6	Tilo Brodbeck	[11] [14]
7	Sergey Bychikhin (Scrgey Bychikhin)	[1]
8	Kiran V. Chatty	[13] [14]
9	Mauro Ciappa	[10]
10	Krzysztof Domanski	[8] [10] [12]
11	S. Drüen	[7]
12	M. Etherton	[9]
13	Wolfgang Fichtner	[3] [5] [10]
14	Robert Gauthier	[13] [14]
15	Horst A. Gieser	[8]
16	Ulrich Glaser	[10] [12]
17	Erich Gornik	[1] [5] [12]
18	Harald Gossner	[1] [2] [3] [4] [5] [6] [7] [14]
19	M. Graf	[9]
20	X. Guggenmos	[3]
21	Ralph Halbach	[13]
22	Michael Heer	[12]
23	Adrien Ille	[14]
24	Junjun Li	[13]
25	Martin Litzenberger	[1] [5]
26	S. Mettler	[9]
27	T. Müller-Lynch	[2]
28	R. Owen	[4]
29	R. Pichler	[1]
30	Dionyz Pogany	[1] [5] [12]
31	Thomas Pompl	[14]
32	N. Qu	[9]
33	K. Reynders	[9]
34	Philipp Riess	[14]
35	Christian Russ	[10] [13]
36	Doris Schmitt-Landsiedel	[7]
37	Robert Schwencker	[7]
38	Christopher Seguin	[13]
39	A. Sieck	[6]
40	Wolfgang Stadler	[3] [5] [6] [7] [8] [9] [11] [12] [14]
41	Matthias Stecher	[2]
42	Martin Streibl	[5] [6] [7] [8] [10]
43	J. Szatkowski	[6]
44	M. Wendel	[3] [5] [6]
45	Wolfgang Wilkening	[9]
46	J. Willemen	[9]
47	Heinrich Wolf	[8]
48	F. Zängl	[4] [7]
49	G. Zimmermann	[4]
50	M. Zubeidat	[9]

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