 | 2012 |
| 15 |  | Peter Ersland,
Roberto Menozzi:
Editorial.
Microelectronics Reliability 52(1): 1 (2012) |
| 2011 |
| 14 |  | Peter Ersland,
Roberto Menozzi:
Editorial.
Microelectronics Reliability 51(2): 187 (2011) |
| 2010 |
| 13 |  | Peter Ersland,
Roberto Menozzi:
Editorial.
Microelectronics Reliability 50(6): 757 (2010) |
| 2009 |
| 12 |  | Peter Ersland,
Roberto Menozzi:
Editorial.
Microelectronics Reliability 49(5): 467 (2009) |
| 11 |  | C. Gil,
Peter Ersland,
A. Li:
Determining DC/RF survivability limits of GaAs semiconductor circuits.
Microelectronics Reliability 49(5): 484-487 (2009) |
| 2008 |
| 10 |  | Samson Mil'shtein,
Peter Ersland:
Progress of quantum electronics and the future of wireless technologies.
Microelectronics Journal 39(3-4): 669-673 (2008) |
| 9 |  | Peter Ersland,
Roberto Menozzi:
Editorial.
Microelectronics Reliability 48(7): 957 (2008) |
| 2007 |
| 8 |  | Peter Ersland,
Roberto Menozzi:
Editorial.
Microelectronics Reliability 47(8): 1155 (2007) |
| 2006 |
| 7 |  | Peter Ersland,
Roberto Menozzi:
Editorial.
Microelectronics Reliability 46(8): 1217 (2006) |
| 6 |  | Shivarajiv Somisetty,
Peter Ersland,
Xinxing Yang,
Jason Barrett:
Reliability investigation and characterization of failure modes in Schottky diodes.
Microelectronics Reliability 46(8): 1254-1260 (2006) |
| 2005 |
| 5 |  | Samson Mil'shtein,
C. Gil,
Peter Ersland:
Heterojunction semiconductor triode - a new vertical device.
Microelectronics Journal 36(3-6): 313-315 (2005) |
| 4 |  | Peter Ersland,
Roberto Menozzi:
Editorial.
Microelectronics Reliability 45(12): 1868 (2005) |
| 2004 |
| 3 |  | Peter Ersland,
Roberto Menozzi:
Editorial.
Microelectronics Reliability 44(7): 1031 (2004) |
| 2 |  | Peter Ersland,
Hei-Ruey Jen,
Xinxing Yang:
Lifetime acceleration model for HAST tests of a pHEMT process.
Microelectronics Reliability 44(7): 1039-1045 (2004) |
| 2003 |
| 1 |  | Samson Mil'shtein,
Peter Ersland,
Shivarajiv Somisetty,
C. Gil:
p-HEMT with tailored field.
Microelectronics Journal 34(5-8): 359-361 (2003) |