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Peter Ersland Coauthor index pubzone.org

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DBLP keys2012
15Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Ersland, Roberto Menozzi: Editorial. Microelectronics Reliability 52(1): 1 (2012)
2011
14Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Ersland, Roberto Menozzi: Editorial. Microelectronics Reliability 51(2): 187 (2011)
2010
13Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Ersland, Roberto Menozzi: Editorial. Microelectronics Reliability 50(6): 757 (2010)
2009
12Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Ersland, Roberto Menozzi: Editorial. Microelectronics Reliability 49(5): 467 (2009)
11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLC. Gil, Peter Ersland, A. Li: Determining DC/RF survivability limits of GaAs semiconductor circuits. Microelectronics Reliability 49(5): 484-487 (2009)
2008
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSamson Mil'shtein, Peter Ersland: Progress of quantum electronics and the future of wireless technologies. Microelectronics Journal 39(3-4): 669-673 (2008)
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Ersland, Roberto Menozzi: Editorial. Microelectronics Reliability 48(7): 957 (2008)
2007
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Ersland, Roberto Menozzi: Editorial. Microelectronics Reliability 47(8): 1155 (2007)
2006
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Ersland, Roberto Menozzi: Editorial. Microelectronics Reliability 46(8): 1217 (2006)
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShivarajiv Somisetty, Peter Ersland, Xinxing Yang, Jason Barrett: Reliability investigation and characterization of failure modes in Schottky diodes. Microelectronics Reliability 46(8): 1254-1260 (2006)
2005
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSamson Mil'shtein, C. Gil, Peter Ersland: Heterojunction semiconductor triode - a new vertical device. Microelectronics Journal 36(3-6): 313-315 (2005)
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Ersland, Roberto Menozzi: Editorial. Microelectronics Reliability 45(12): 1868 (2005)
2004
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Ersland, Roberto Menozzi: Editorial. Microelectronics Reliability 44(7): 1031 (2004)
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPeter Ersland, Hei-Ruey Jen, Xinxing Yang: Lifetime acceleration model for HAST tests of a pHEMT process. Microelectronics Reliability 44(7): 1039-1045 (2004)
2003
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSamson Mil'shtein, Peter Ersland, Shivarajiv Somisetty, C. Gil: p-HEMT with tailored field. Microelectronics Journal 34(5-8): 359-361 (2003)

Coauthor Index

1Jason Barrett [6]
2C. Gil [1] [5] [11]
3Hei-Ruey Jen [2]
4A. Li [11]
5Roberto Menozzi [3] [4] [7] [8] [9] [12] [13] [14] [15]
6Samson Mil'shtein [1] [5] [10]
7Shivarajiv Somisetty [1] [6]
8Xinxing Yang [2] [6]

Colors in the list of coauthors

Last update Tue May 29 20:41:18 2012 CET by the DBLP TeamThis material is Open Data Data released under the ODC-BY 1.0 license — See also our legal information page