Yungseon Eo

	2010
16		Dongchul Kim, Hyewon Kim, Yungseon Eo: Signal integrity verification of coupled interconnect lines using efficient eye-diagram determination. ISCAS 2010: 3669-3672
15		Hyunsik Kim, Yungseon Eo: Compact CAD Models for the Signal Integrity Verification of Multi-Coupled Transmission Lines. IEICE Transactions 93-A(4): 752-760 (2010)
	2008
14		Taehoon Kim, Dongchul Kim, Jung-A Lee, Yungseon Eo: Compact Models for Signal Transient and Crosstalk Noise of Coupled RLC Interconnect Lines with Ramp Inputs. DELTA 2008: 205-209
13		Dongchul Kim, Taehoon Kim, Jung-A Lee, Yungseon Eo: Experimental Characterisations of Coupled Transmission Lines. DELTA 2008: 262-265
12		Taehoon Kim, Yungseon Eo: Analytical CAD Models for the Signal Transients and Crosstalk Noise of Inductance-Effect-Prominent Multicoupled RLC Interconnect Lines. IEEE Trans. on CAD of Integrated Circuits and Systems 27(7): 1214-1227 (2008)
	2007
11		Taeyong Je, Yungseon Eo: Efficient Signal Integrity Verification of Multi-Coupled Transmission Lines with Asynchronously Switching Non-Linear Drivers. ISQED 2007: 245-250
10		Hyunsik Kim, Yungseon Eo: High-Frequency-Measurement-Based Frequency-Variant Transmission Line Characterization and Circuit Modeling for Accurate Signal Integrity Verification. ISQED 2007: 507-512
	2006
9		Seongkyun Shin, Yungseon Eo: Non-Physical Pseudo-Wave-Based Modal Decoupling Technique of Multi- Coupled Co-Planar Transmission Lines with Homogeneous Dielectric Media. ISQED 2006: 278-283
8		Taeyong Je, Yungseon Eo: Efficient Signal Integrity Verification Method of Multi-Coupled RLC Interconnect Lines with Asynchronous Circuit Switching. ISQED 2006: 419-424
	2004
7		Seongkyun Shin, Yungseon Eo, William R. Eisenstadt, Jongin Shim: Analytical Dynamic Time Delay Model of Strongly Coupled RLC Interconnect Lines Dependent on Switching. ISQED 2004: 337-342
6		Seongkyun Shin, Yungseon Eo, William R. Eisenstadt, Jongin Shim: Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects. IEEE Trans. VLSI Syst. 12(4): 395-407 (2004)
5		Yungseon Eo, Seongkyun Shin, William R. Eisenstadt, Jongin Shim: A decoupling technique for efficient timing analysis of VLSI interconnects with dynamic circuit switching. IEEE Trans. on CAD of Integrated Circuits and Systems 23(9): 1321-1337 (2004)
	2002
4		Seongkyun Shin, Yungseon Eo, William R. Eisenstadt, Jongin Shim: Analytical signal integrity verification models for inductance-dominant multi-coupled VLSI interconnects. SLIP 2002: 61-68
3		Yungseon Eo, Seongkyun Shin, William R. Eisenstadt, Jongin Shim: Generalized traveling-wave-based waveform approximation technique for the efficient signal integrity verification of multicoupled transmission line system. IEEE Trans. on CAD of Integrated Circuits and Systems 21(12): 1489-1497 (2002)
2		Yungseon Eo, Jongin Shim, William R. Eisenstadt: A traveling-wave-based waveform approximation technique for thetiming verification of single transmission lines. IEEE Trans. on CAD of Integrated Circuits and Systems 21(6): 723-730 (2002)
	2001
1		Woojin Jin, Yungseon Eo, William R. Eisenstadt, Jongin Shim: Fast and accurate quasi-three-dimensional capacitance determination of multilayer VLSI interconnects. IEEE Trans. VLSI Syst. 9(3): 450-460 (2001)

Coauthor Index

1	William R. Eisenstadt	[1] [2] [3] [4] [5] [6] [7]
2	Taeyong Je	[8] [11]
3	Woojin Jin	[1]
4	Dongchul Kim	[13] [14] [16]
5	Hyewon Kim	[16]
6	Hyunsik Kim	[10] [15]
7	Taehoon Kim	[12] [13] [14]
8	Jung-A Lee	[13] [14]
9	Jongin Shim	[1] [2] [3] [4] [5] [6] [7]
10	Seongkyun Shin	[3] [4] [5] [6] [7] [9]

Colors in the list of coauthors

Last update Tue May 29 20:41:18 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page