 | 2011 |
| 9 |  | N. Ruiz Amador,
V. Huard,
E. Pion,
F. Cacho,
Damien Croain,
V. Robert,
Sylvain Engels,
Philippe Flatresse,
L. Anghel:
Bottom-up digital system-level reliability modeling.
CICC 2011: 1-4 |
| 8 |  | Julien Le Coz,
Philippe Flatresse,
Sylvain Engels,
Alexandre Valentian,
Marc Belleville,
Christine Raynaud,
Damien Croain,
Pascal Urard:
Comparison of 65nm LP bulk and LP PD-SOI with adaptive power gate body bias for an LDPC codec.
ISSCC 2011: 336-337 |
| 2010 |
| 7 |  | Nabila Moubdi,
Philippe Maurine,
Robin Wilson,
Sylvain Engels,
Nadine Azémard,
Vincent Dumettier,
Pierre Busson:
On-Chip Process Variability Monitoring Flow.
J. Low Power Electronics 6(4): 601-606 (2010) |
| 2009 |
| 6 |  | Nabila Moubdi,
Philippe Maurine,
Robin Wilson,
Nadine Azémard,
Vincent Dumettier,
Abhishek Bansal,
Sebastien Barasinski,
Alain Tournier,
Guy Durieu,
David Meyer,
Pierre Busson,
Sarah Verhaeren,
Sylvain Engels:
Product On-Chip Process Compensation for Low Power and Yield Enhancement.
PATMOS 2009: 247-255 |
| 5 |  | V. Migairou,
Robin Wilson,
Sylvain Engels,
Zequin Wu,
Nadine Azémard,
Philippe Maurine:
Timing margin evaluation with a simple statistical timing analysis flow.
J. Embedded Computing 3(3): 221-229 (2009) |
| 2007 |
| 4 |  | V. Migairou,
Robin Wilson,
Sylvain Engels,
Zequin Wu,
Nadine Azémard,
Philippe Maurine:
A Simple Statistical Timing Analysis Flow and Its Application to Timing Margin Evaluation.
PATMOS 2007: 138-147 |
| 2006 |
| 3 |  | V. Migairou,
Robin Wilson,
Sylvain Engels,
Nadine Azémard,
Philippe Maurine:
Statistical Characterization of Library Timing Performance.
PATMOS 2006: 468-476 |
| 2 |  | B. Lasbouygues,
Sylvain Engels,
Robin Wilson,
Philippe Maurine,
Nadine Azémard,
Daniel Auvergne:
Logical effort model extension to propagation delay representation.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(9): 1677-1684 (2006) |
| 1 |  | Sylvain Engels,
Robin Wilson,
Nadine Azémard,
Philippe Maurine:
A comprehensive performance macro-modeling of on-chip RC interconnects considering line shielding effects.
Integration 39(4): 433-456 (2006) |