Yi-Chuen Eng

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2008

2 Jyi-Tsong Lin, Yi-Chuen Eng: Analysis of Block Oxide Height Variations for a 40nm Gate Length bFDSOI-FET. JCP 3(5): 41-45 (2008)

2007

1 Jyi-Tsong Lin, Yi-Chuen Eng, Tai-Yi Lee, Kao-Cheng Lin: Analysis of Si-body thickness variation for a new 40 nm gate length bFDSOI. VLSI Design 2007: 653-656

	2008
2		Jyi-Tsong Lin, Yi-Chuen Eng: Analysis of Block Oxide Height Variations for a 40nm Gate Length bFDSOI-FET. JCP 3(5): 41-45 (2008)
	2007
1		Jyi-Tsong Lin, Yi-Chuen Eng, Tai-Yi Lee, Kao-Cheng Lin: Analysis of Si-body thickness variation for a new 40 nm gate length bFDSOI. VLSI Design 2007: 653-656

Coauthor Index

1 Tai-Yi Lee [1]

2 Jyi-Tsong Lin [1] [2]

3 Kao-Cheng Lin [1]

Last update Tue May 29 20:41:18 2012 CET by the DBLP Team —

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