Michiaki Emori

	2008
5		Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo: Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate. IEICE Transactions 91-D(3): 726-735 (2008)
	2006
4		Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo: Test Data Compression of 100x for Scan-Based BIST. ITC 2006: 1-10
	2003
3		Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi, Koichi Itaya, Michiaki Emori, Hitoshi Yamanaka, Takashi Mochiyama: BIST-Aided Scan Test - A New Method for Test Cost Reduction. VTS 2003: 359-364
	1997
2		Michiaki Emori, Junko Kumagai, Koichi Itaya, Takashi Aikyo, Tomoko Anan, Junichi Niimi: ATREX : Design for Testability System for Mega Gate LSIs. Asian Test Symposium 1997: 126-
	1990
1		Michiaki Emori, Takashi Aikyo, Yasuhide Machida, Jun-ichi Shikatani: ASIC CAD system based on hierarchical design-for-testability. ITC 1990: 404-409

Coauthor Index

1	Takashi Aikyo	[1] [2] [4] [5]
2	Tomoko Anan	[2]
3	Masayuki Arai	[4] [5]
4	Kwame Osei Boateng	[3]
5	Satoshi Fukumoto	[4] [5]
6	Takahisa Hiraide	[3] [4] [5]
7	Koichi Itaya	[2] [3]
8	Kazuhiko Iwasaki	[4] [5]
9	Hideaki Konishi	[3] [4] [5]
10	Junko Kumagai	[2]
11	Yasuhide Machida	[1]
12	Tatsuru Matsuo	[4] [5]
13	Takashi Mochiyama	[3]
14	Junichi Niimi	[2]
15	Jun-ichi Shikatani	[1]
16	Hitoshi Yamanaka	[3]

Last update Tue May 29 20:41:18 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page