Sven Van Elshocht

	2007
2		Z. Li, T. Schram, L. Pantisano, A. Stesmans, Thierry Conard, S. Shamuilia, V. V. Afanasiev, A. Akheyar, Sven Van Elshocht, D. P. Brunco, W. Deweerd, Y. Naoki, P. Lehnen, Stefan De Gendt, K. De Meyer: Mechanism of O2-anneal induced Vfb shifts of Ru gated stacks. Microelectronics Reliability 47(4-5): 518-520 (2007)
	2005
1		Vidya Kaushik, Martine Claes, Annelies Delabie, Sven Van Elshocht, Olivier Richard, Thierry Conard, Erika Rohr, Thomas Witters, Matty Caymax, Stefan De Gendt: Observation and characterization of defects in HfO2 high-K gate dielectric layers. Microelectronics Reliability 45(5-6): 798-801 (2005)

Coauthor Index

1	V. V. Afanasiev	[2]
2	A. Akheyar	[2]
3	D. P. Brunco	[2]
4	Matty Caymax	[1]
5	Martine Claes	[1]
6	Thierry Conard	[1] [2]
7	Annelies Delabie	[1]
8	W. Deweerd	[2]
9	Stefan De Gendt	[1] [2]
10	Vidya Kaushik	[1]
11	P. Lehnen	[2]
12	Z. Li	[2]
13	K. De Meyer	[2]
14	Y. Naoki	[2]
15	L. Pantisano	[2]
16	Olivier Richard	[1]
17	Erika Rohr	[1]
18	T. Schram	[2]
19	S. Shamuilia	[2]
20	A. Stesmans	[2]
21	Thomas Witters	[1]

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