Melanie Elm

	2011
7		Alejandro Cook, Melanie Elm, Hans-Joachim Wunderlich, Ulrich Abelein: Structural In-Field Diagnosis for Random Logic Circuits. European Test Symposium 2011: 111-116
6		Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich: Structural Test for Graceful Degradation of NoC Switches. European Test Symposium 2011: 183-188
	2010
5		Melanie Elm, Michael A. Kochte, Hans-Joachim Wunderlich: On Determining the Real Output Xs by SAT-Based Reasoning. Asian Test Symposium 2010: 39-44
4		Melanie Elm, Hans-Joachim Wunderlich: BISD: Scan-based Built-In self-diagnosis. DATE 2010: 1243-1248
	2009
3		Michael A. Kochte, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich: Test Encoding for Extreme Response Compaction. European Test Symposium 2009: 155-160
	2008
2		Melanie Elm, Hans-Joachim Wunderlich, Michael E. Imhof, Christian G. Zoellin, Jens Leenstra, Nicolas Mäding: Scan chain clustering for test power reduction. DAC 2008: 828-833
1		Melanie Elm, Hans-Joachim Wunderlich: Scan Chain Organization for Embedded Diagnosis. DATE 2008: 468-473

Coauthor Index

1	Ulrich Abelein	[7]
2	Alejandro Cook	[7]
3	Atefe Dalirsani	[6]
4	Stefan Holst	[3] [6]
5	Michael E. Imhof	[2]
6	Michael A. Kochte	[3] [5]
7	Jens Leenstra	[2]
8	Nicolas Mäding	[2]
9	Hans-Joachim Wunderlich	[1] [2] [3] [4] [5] [6] [7]
10	Christian G. Zoellin	[2]

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