Akilah Ellis

	1998
1		Elizabeth M. Rudnick, Roberto Vietti, Akilah Ellis, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda: Fast Sequential Circuit Test Generation Using High-Level and Gate-Level Techniques. DATE 1998: 570-576

Coauthor Index

1	Fulvio Corno	[1]
2	Paolo Prinetto	[1]
3	Matteo Sonza Reorda	[1]
4	Elizabeth M. Rudnick	[1]
5	Roberto Vietti	[1]

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