 | 2011 |
| 5 |  | Sigrid Eldh,
Hans Hansson,
Sasikumar Punnekkat:
Analysis of Mistakes as a Method to Improve Test Case Design.
ICST 2011: 70-79 |
| 2010 |
| 4 |  | Yuanyuan Zhang,
Enrique Alba,
Juan José Durillo,
Sigrid Eldh,
Mark Harman:
Today/future importance analysis.
GECCO 2010: 1357-1364 |
| 3 |  | Sigrid Eldh,
Joachim Brandt,
Mark Street,
Hans Hansson,
Sasikumar Punnekkat:
Towards Fully Automated Test Management for Large Complex Systems.
ICST 2010: 412-420 |
| 2007 |
| 2 |  | Sigrid Eldh,
Sasikumar Punnekkat,
Hans Hansson,
Peter Jönsson:
Component Testing Is Not Enough - A Study of Software Faults in Telecom Middleware.
TestCom/FATES 2007: 74-89 |
| 2006 |
| 1 |  | Sigrid Eldh,
Hans Hansson,
Sasikumar Punnekkat,
Anders Pettersson,
Daniel Sundmark:
A Framework for Comparing Efficiency, Effectiveness and Applicability of Software Testing Techniques.
TAIC PART 2006: 159-170 |