 | 1992 |
| 13 |  | Wei-Cheng Her,
Lin-Ming Jin,
Yacoub M. El-Ziq:
An ATPG Driver Selection Algorithm for Interconnect Test with Boundary Scan.
ITC 1992: 382-388 |
| 1990 |
| 12 |  | Youngju Won,
Sartaj Sahni,
Yacoub M. El-Ziq:
A Hardware Accelerator for Maze Routing.
IEEE Trans. Computers 39(1): 141-145 (1990) |
| 1987 |
| 11 |  | Youngju Won,
Sartaj Sahni,
Yacoub M. El-Ziq:
A Hardware Accelerator for Maze Routing.
DAC 1987: 800-806 |
| 1984 |
| 10 |  | Yacoub M. El-Ziq,
Hamid H. Butt:
Impact of Mixed-Mode Self Test on Life Cycle Cost of VLSI Based Design.
ITC 1984: 338-349 |
| 1983 |
| 9 |  | Yacoub M. El-Ziq,
Hamid H. Butt:
A Mixed-Mode Built-In Self-Test Technique Using Scan Path and Signature Analysis.
ITC 1983: 269-274 |
| 1982 |
| 8 |  | Yacoub M. El-Ziq,
Stephen Y. H. Su:
Fault Diagnosis of MOS Combinational Networks.
IEEE Trans. Computers 31(2): 129-139 (1982) |
| 1981 |
| 7 |  | Yacoub M. El-Ziq:
Automatic test generation for stuck-open faults in CMOS VLSI.
DAC 1981: 347-354 |
| 6 |  | Yacoub M. El-Ziq,
Richard J. Cloutier:
Functional-Level Test Generation for Stuck-Open Faults in CMOS VLSI.
ITC 1981: 536-546 |
| 1980 |
| 5 |  | Yacoub M. El-Ziq:
A new test pattern generation system.
DAC 1980: 62-68 |
| 1979 |
| 4 |  | Yacoub M. El-Ziq:
Testing of MOS combinational networks a procedure for efficient fault simulation and test generation.
DAC 1979: 162-170 |
| 1978 |
| 3 |  | Yacoub M. El-Ziq:
Logic design automation of MOS combinational networks with fan-in, fan-out constraints.
DAC 1978: 240-249 |
| 2 |  | Yacoub M. El-Ziq,
Stephen Y. H. Su:
Computer-Aided Logic Design of Two-Level MOS Combinational Networks with Statistical Results.
IEEE Trans. Computers 27(10): 911-923 (1978) |
| 1977 |
| 1 |  | Yacoub M. El-Ziq,
Stephen Y. H. Su:
Logic design automation of diagnosable MOS combinational logic networks.
DAC 1977: 205-215 |