Bill Eklow

William Eklow

	2012
28		Qiang Xu, Li Jiang, Huiyun Li, Bill Eklow: Yield enhancement for 3D-stacked ICs: Recent advances and challenges. ASP-DAC 2012: 731-737
27		Li Jiang, Qiang Xu, Bill Eklow: On effective TSV repair for 3D-stacked ICs. DATE 2012: 793-798
	2011
26		Bill Eklow, R. D. (Shawn) Blanton: 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011 IEEE 2011
25		Bill Eklow: Major Milestones for Two IEEE Standards Groups in 2011. IEEE Design & Test of Computers 28(6): 85-87 (2011)
	2009
24		Gordon W. Roberts, Bill Eklow: 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009 IEEE 2009
23		Luca Amati, Cristiana Bolchini, Laura Frigerio, Fabio Salice, William Eklow, Arnold Suvatne, Eugenio Brambilla, Federico Franzoso, Michele Martin: An Incremental Approach to Functional Diagnosis. DFT 2009: 392-400
	2008
22		Brice Achkir, Pavel Zivny, Bill Eklow: Parametric Testing of Optical Interfaces. ITC 2008: 1
21		John Malian, Bill Eklow: Embedded Testing in an In-Circuit Test Environment. ITC 2008: 1-6
	2006
20		Bill Eklow, Ben Bennetts: New Techniques for Accessing Embedded Instrumentation: IEEE P1687 (IJTAG). European Test Symposium 2006: 253-254
19		Ken Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, J.-F. Cote: IEEE P1687: Toward Standardized Access of Embedded Instrumentation. ITC 2006: 1-8
18		Sylvain Tourangeau, Bill Eklow: Test Economics - What can a Board/System Test Engineer do to Influence Supply Operation Metrics. ITC 2006: 1-9
	2005
17		Zoe Conroy, Geoff Richmond, Xinli Gu, Bill Eklow: A practical perspective on reducing ASIC NTFs. ITC 2005: 7
16		Bill Eklow: An update on IEEE 1149.6 - successes and issues. ITC 2005: 7
15		Carlos O'Farrill, Merouane Moakil-Chbany, Bill Eklow: Optimized reasoning-based diagnosis for non-random, board-level, production defects. ITC 2005: 7
14		Jeff Rearick, Bill Eklow, Ken Posse, Al Crouch, Ben Bennetts: IJTAG (internal JTAG): a step toward a DFT standard. ITC 2005: 8
	2004
13		Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts: Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. DATE 2004: 1184-1191
12		Bill Eklow: IP Testing - The Future Differentiator? DATE 2004: 6-9
11		Sunil Kalidindi, Nghia Huynh, Bill Eklow, Josh Goldstein: "Real Life" System Testing of Networking Equipment. ITC 2004: 1072-1077
10		Bill Eklow: What Do You Mean My Board Test Stinks? ITC 2004: 1423
9		Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan Arild Tofte, Mark Kassab, Janusz Rajski: Realizing High Test Quality Goals with Smart Test Resource Usage. ITC 2004: 525-533
8		Bill Eklow, Anoosh Hosseini, Chi Khuong, Shyam Pullela, Toai Vo, Hien Chau: Simulation Based System Level Fault Insertion Using Co-verification Tools. ITC 2004: 704-710
	2003
7		Bill Eklow, Carl Barnhart, Mike Ricchetti, Terry Borroz: IEEE 1149.6 - A Practical Perspective. ITC 2003: 494-502
6		Bill Eklow, Carl Barnhart, Kenneth P. Parker: IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks. IEEE Design & Test of Computers 20(5): 76-83 (2003)
	2002
5		Bill Eklow, Carl Barnhart, Kenneth P. Parker: IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks. ITC 2002: 1056-1065
4		Bill Eklow: Is Board Test Worth Talking About? ITC 2002: 1235
	2001
3		William Eklow, Richard M. Sedmak, Dan Singletary, Toai Vo: Unsafe board states during PC-based boundary-scan testing. ITC 2001: 615-623
	1998
2		Bulent I. Dervisoglu, Mike Ricchetti, William Eklow: Shared I/O-cell structures: a framework for extending the IEEE 1149.1 boundary-scan standard. ITC 1998: 980-989
	1994
1		William Eklow: Optimizing Boundary Scan in a Proprietary Environment. ITC 1994: 1024

Coauthor Index

1	Brice Achkir	[22]
2	Luca Amati	[23]
3	Carl Barnhart	[5] [6] [7] [13]
4	Ben Bennetts (R. G. Bennetts)	[13] [14] [19] [20]
5	R. D. (Shawn) Blanton (Ronald D. Blanton)	[26]
6	Cristiana Bolchini	[23]
7	Dave Bonnett	[13]
8	Terry Borroz	[7]
9	Eugenio Brambilla	[23]
10	Hien Chau	[8]
11	Zoe Conroy	[17]
12	J.-F. Cote	[19]
13	Adam Cron	[13]
14	Alfred L. Crouch (Al Crouch)	[14] [19]
15	Bulent I. Dervisoglu	[2]
16	Jason Doege	[19]
17	Federico Franzoso	[23]
18	Laura Frigerio	[23]
19	Josh Goldstein	[11]
20	Xinli Gu	[9] [17]
21	Anoosh Hosseini	[8]
22	Nghia Huynh	[11]
23	Neil Jacobson	[13]
24	Li Jiang	[27] [28]
25	Sunil Kalidindi	[11]
26	Mark Kassab	[9]
27	Chi Khuong	[8]
28	Mike Laisne	[19]
29	Abby Lee	[9]
30	Huiyun Li	[28]
31	John Malian	[21]
32	Michele Martin	[23]
33	Merouane Moakil-Chbany	[15]
34	Carlos O'Farrill	[15]
35	Adam Osseiran	[13]
36	Kenneth P. Parker	[5] [6]
37	Ken Posse	[14] [19]
38	Shyam Pullela	[8]
39	Janusz Rajski	[9]
40	Jeff Rearick	[14] [19]
41	Mike Ricchetti	[2] [7] [19]
42	Geoff Richmond	[17]
43	Gordon W. Roberts	[24]
44	Fabio Salice	[23]
45	Richard M. Sedmak	[3]
46	Dan Singletary	[3]
47	Stephen K. Sunter (Steve Sunter)	[13]
48	Arnold Suvatne	[23]
49	Jan Arild Tofte	[9]
50	Sylvain Tourangeau	[18]
51	Kun-Han Tsai	[9]
52	Toai Vo	[3] [8]
53	Cyndee Wang	[9]
54	Qiang Xu	[27] [28]
55	Pavel Zivny	[22]

Colors in the list of coauthors

Last update Tue May 29 20:41:18 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page