 | 2011 |
| 29 |  | Shadi M. Harb,
William R. Eisenstadt,
Robert M. Fox:
A sub-1V CMOS voltage reference generator.
ISCAS 2011: 901-904 |
| 2010 |
| 28 |  | Devin Morris,
William R. Eisenstadt,
Andrea Paganini,
Mustapha Slamani,
Timothy Platt,
John Ferrario:
Synthetic DSP approach for novel FPGA-based measurement of error vector magnitude.
ITC 2010: 237-244 |
| 2009 |
| 27 |  | Moishe Groger,
Shadi M. Harb,
Devin Morris,
William R. Eisenstadt,
Sudeep Puligundla:
High speed I/O and thermal effect characterization of 3D stacked ICs.
3DIC 2009: 1-5 |
| 2008 |
| 26 |  | Saleh Abdel-Hafeez,
Shadi M. Harb,
William R. Eisenstadt:
High speed digital CMOS divide-by-N fequency divider.
ISCAS 2008: 592-595 |
| 25 |  | Qizhang Yin,
William R. Eisenstadt,
Tian Xia:
Wireless System for Microwave Test Signal Generation.
IEEE Design & Test of Computers 25(2): 160-166 (2008) |
| 2007 |
| 24 |  | Xueqing Wang,
William R. Eisenstadt,
Robert M. Fox:
Embedded Jitter Measurement of High-speed I/O Signals.
ISCAS 2007: 153-156 |
| 23 |  | Saleh Abdel-Hafeez,
Shadi M. Harb,
William R. Eisenstadt:
Low-Power Content Addressable Memory With Read/Write and Matched Mask Ports.
PATMOS 2007: 75-85 |
| 22 |  | Saleh Abdel-Hafeez,
Shadi M. Harb,
William R. Eisenstadt:
A low-power CAM using a 12-transistor design cell.
VLSI-SoC 2007: 264-269 |
| 2006 |
| 21 |  | Kooho Jung,
William R. Eisenstadt,
Robert M. Fox:
SPICE-based mixed-mode S-parameter calculations for four-port and three-port circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(5): 909-913 (2006) |
| 2005 |
| 20 |  | Donghoon Han,
Selim Sermet Akbay,
Soumendu Bhattacharya,
Abhijit Chatterjee,
William R. Eisenstadt:
On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST).
IOLTS 2005: 106-111 |
| 19 |  | Qizhang Yin,
William R. Eisenstadt,
Robert M. Fox,
Tao Zhang:
A translinear RMS detector for embedded test of RF ICs.
IEEE T. Instrumentation and Measurement 54(5): 1708-1714 (2005) |
| 18 |  | Jangsup Yoon,
William R. Eisenstadt:
Embedded loopback test for RF ICs.
IEEE T. Instrumentation and Measurement 54(5): 1715-1720 (2005) |
| 2004 |
| 17 |  | Jangsup Yoon,
William R. Eisenstadt:
Lumped passive circuits for 5GHz embedded test of RF SoCs.
ISCAS (1) 2004: 241-244 |
| 16 |  | Qizhang Yin,
Robert M. Fox,
William R. Eisenstadt:
A translinear-based RF RMS detector for embedded test.
ISCAS (1) 2004: 245-248 |
| 15 |  | Tao Zhang,
William R. Eisenstadt,
Robert M. Fox:
A novel 5GHz RF power detector.
ISCAS (1) 2004: 897-900 |
| 14 |  | Seongkyun Shin,
Yungseon Eo,
William R. Eisenstadt,
Jongin Shim:
Analytical Dynamic Time Delay Model of Strongly Coupled RLC Interconnect Lines Dependent on Switching.
ISQED 2004: 337-342 |
| 13 |  | Seongkyun Shin,
Yungseon Eo,
William R. Eisenstadt,
Jongin Shim:
Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects.
IEEE Trans. VLSI Syst. 12(4): 395-407 (2004) |
| 12 |  | Yungseon Eo,
Seongkyun Shin,
William R. Eisenstadt,
Jongin Shim:
A decoupling technique for efficient timing analysis of VLSI interconnects with dynamic circuit switching.
IEEE Trans. on CAD of Integrated Circuits and Systems 23(9): 1321-1337 (2004) |
| 2003 |
| 11 |  | Sanghoon Choi,
William R. Eisenstadt,
Robert M. Fox:
Design of programmable embedded IF source for design self-test.
ISCAS (5) 2003: 241-244 |
| 10 |  | William R. Eisenstadt:
Improving Wireless Product Testing via University and Industry Collaboration.
ITC 2003: 1288 |
| 2002 |
| 9 |  | Seongkyun Shin,
Yungseon Eo,
William R. Eisenstadt,
Jongin Shim:
Analytical signal integrity verification models for inductance-dominant multi-coupled VLSI interconnects.
SLIP 2002: 61-68 |
| 8 |  | Robert C. Aitken,
Mustapha Slamani,
H. Ding,
William R. Eisenstadt,
Sanghoon Choi,
John McLaughlin:
Wireless Test.
VTS 2002: 173-174 |
| 7 |  | Yungseon Eo,
Seongkyun Shin,
William R. Eisenstadt,
Jongin Shim:
Generalized traveling-wave-based waveform approximation technique for the efficient signal integrity verification of multicoupled transmission line system.
IEEE Trans. on CAD of Integrated Circuits and Systems 21(12): 1489-1497 (2002) |
| 6 |  | Yungseon Eo,
Jongin Shim,
William R. Eisenstadt:
A traveling-wave-based waveform approximation technique for thetiming verification of single transmission lines.
IEEE Trans. on CAD of Integrated Circuits and Systems 21(6): 723-730 (2002) |
| 2001 |
| 5 |  | Robert M. Fox,
H. J. Ko,
William R. Eisenstadt:
High-gain common-mode feedback circuits for differential log-domain filters.
ISCAS (1) 2001: 560-563 |
| 4 |  | Woojin Jin,
Yungseon Eo,
William R. Eisenstadt,
Jongin Shim:
Fast and accurate quasi-three-dimensional capacitance determination of multilayer VLSI interconnects.
IEEE Trans. VLSI Syst. 9(3): 450-460 (2001) |
| 1999 |
| 3 |  | Y. Ro,
William R. Eisenstadt,
Robert M. Fox:
New 1.4 volt transconductor with superior power supply rejection.
ISCAS (2) 1999: 644-647 |
| 1987 |
| 2 |  | Herman Lam,
Stanley Y. W. Su,
F. L. C. Seeger,
William R. Eisenstadt:
A Special Function Unit for Database Operations Within a Data-Control Flow System.
ICPP 1987: 330-339 |
| 1986 |
| 1 |  | Surya Veeraraghavan,
Jerry G. Fossum,
William R. Eisenstadt:
SPICE Simulation of SOI MOSFET Integrated Circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 5(4): 653-658 (1986) |