M. Eisele

	1997
2		M. Eisele, Jörg Berthold, Doris Schmitt-Landsiedel, R. Mahnkopf: The impact of intra-die device parameter variations on path delays and on the design for yield of low voltage digital circuits. IEEE Trans. VLSI Syst. 5(4): 360-368 (1997)
	1996
1		M. Eisele, Jörg Berthold, Doris Schmitt-Landsiedel, R. Mahnkopf: The impact of intra-die device parameter variations on path delays and on the design for yield of low voltage digital circuits. ISLPED 1996: 237-242

Coauthor Index

1	Jörg Berthold	[1] [2]
2	R. Mahnkopf	[1] [2]
3	Doris Schmitt-Landsiedel	[1] [2]

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