Stefan Eichenberger

	2011
23		Daniel Arumí, Rosa Rodríguez Montanes, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman: Gate Leakage Impact on Full Open Defects in Interconnect Lines. IEEE Trans. VLSI Syst. 19(12): 2209-2220 (2011)
22		Daniel Arumí, Rosa Rodríguez Montanes, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman: Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out. IEEE Trans. on CAD of Integrated Circuits and Systems 30(12): 1911-1922 (2011)
	2010
21		Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman: Diagnosis of full open defects in interconnect lines with fan-out. European Test Symposium 2010: 233-238
20		Friedrich Hapke, Wilfried Redemund, Jürgen Schlöffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger: Defect-oriented cell-internal testing. ITC 2010: 285-294
19		Lavanya Jagan, Camelia Hora, Bram Kruseman, Stefan Eichenberger, Ananta K. Majhi, V. Kamakoti: Impact of Temperature on Test Quality. VLSI Design 2010: 276-281
	2009
18		Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson: Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. ITC 2009: 1-10
	2008
17		Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman: Time-dependent Behaviour of Full Open Defects in Interconnect Lines. ITC 2008: 1-10
16		Stefan Eichenberger, Jeroen Geuzebroek, Camelia Hora, Bram Kruseman, Ananta K. Majhi: Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality. ITC 2008: 1-10
15		Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman: Full Open Defects in Nanometric CMOS. VTS 2008: 119-124
	2007
14		Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi: Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. VTS 2007: 145-150
13		Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi: Diagnosis of Full Open Defects in Interconnecting Lines. VTS 2007: 158-166
12		Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen: Memory Testing Under Different Stress Conditions: An Industrial Evaluation CoRR abs/0710.4693: (2007)
11		Jing Wang, Duncan M. Hank Walker, Xiang Lu, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul J. A. M. van de Wiel, Stefan Eichenberger: Modeling Power Supply Noise in Delay Testing. IEEE Design & Test of Computers 24(3): 226-234 (2007)
	2006
10		Jing Wang, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger: Power Supply Noise in Delay Testing. ITC 2006: 1-10
	2005
9		Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen: Memory Testing Under Different Stress Conditions: An Industrial Evaluation. DATE 2005: 438-443
	2004
8		Bram Kruseman, Ananta K. Majhi, Guido Gronthoud, Stefan Eichenberger: On Hazard-free Patterns for Fine-delay Fault Testing. ITC 2004: 213-222
7		Bram Kruseman, Ananta K. Majhi, Camelia Hora, Stefan Eichenberger, Johan Meirlevede: Systematic Defects in Deep Sub-Micron Technologies. ITC 2004: 290-299
6		Subhasish Mitra, Erik H. Volkerink, Edward J. McCluskey, Stefan Eichenberger: Delay Defect Screening using Process Monitor Structures. VTS 2004: 43-52
5		Rob Aitken, Stefan Eichenberger, Gary Maier, Sandip Kundu, Hank Walker: ITC 2003 Roundtable: Design for Manufacturability. IEEE Design & Test of Computers 21(2): 144-156 (2004)
	2003
4		Stefan Eichenberger: Design for Manufacturability - or the meaning of 'subtle'. ITC 2003: 1316
3		Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger: Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model. VTS 2003: 345-350
2		Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg: On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up. J. Electronic Testing 19(4): 369-376 (2003)
	2002
1		Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg: An Effective Diagnosis Method to Support Yield Improvement. ITC 2002: 260-269

Coauthor Index

1	Dan Adolfsson	[18]
2	Robert C. Aitken (Rob Aitken)	[5]
3	Daniel Arumí	[13] [14] [15] [17] [21] [22] [23]
4	Mohamed Azimane	[9] [12]
5	Fred Bowen	[9] [12]
6	Joan Figueras	[13] [14] [15] [17] [21] [22] [23]
7	Jeroen Geuzebroek	[16]
8	Andreas Glowatz	[18] [20]
9	Guido Gronthoud	[3] [8] [9] [10] [11] [12]
10	Friedrich Hapke	[18] [20]
11	Hamidreza Hashempour	[18] [20]
12	Camelia Hora	[1] [2] [3] [7] [13] [14] [15] [16] [17] [18] [19] [21] [22] [23]
13	Lavanya Jagan	[19]
14	V. Kamakoti	[19]
15	Rene Krenz-Baath	[18] [20]
16	Bram Kruseman	[7] [8] [10] [11] [13] [14] [15] [16] [17] [19] [21] [22] [23]
17	Sandip Kundu	[5]
18	Maurice Lousberg	[1] [2] [3] [9] [12] [13] [14]
19	Xiang Lu	[11]
20	Gary Maier	[5]
21	Ananta K. Majhi	[3] [7] [8] [9] [10] [11] [12] [13] [14] [16] [19]
22	Edward J. McCluskey	[6]
23	Johan Meirlevede	[7]
24	Subhasish Mitra	[6]
25	Rosa Rodríguez Montanes	[22] [23]
26	Wilfried Redemund	[20]
27	Rosa Rodríguez-Montañés	[13] [14] [15] [17] [21]
28	Jürgen Schlöffel	[18] [20]
29	Rene Segers	[1] [2]
30	Pop Valer	[3]
31	Luis Elvira Villagra	[10] [11]
32	Erik H. Volkerink	[6]
33	D. M. H. Walker (Duncan M. Hank Walker)	[10] [11]
34	Hank Walker	[5]
35	Jing Wang	[10] [11]
36	Paul van de Wiel (Paul J. A. M. van de Wiel)	[10] [11]
37	Michael Wittke	[20]

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