Stina Edbom

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2007

3 Erik Larsson, Stina Edbom: Test data truncation for test quality maximisation under ATE memory depth constraint. IET Computers & Digital Techniques 1(1): 27-37 (2007)

2005

2 Erik Larsson, Stina Edbom: Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint. VLSI-SoC 2005: 221-244

2004

1 Stina Edbom, Erik Larsson: An Integrated Technique for Test Vector Selection and Test Scheduling under Test Time Constraint. Asian Test Symposium 2004: 254-257

	2007
3		Erik Larsson, Stina Edbom: Test data truncation for test quality maximisation under ATE memory depth constraint. IET Computers & Digital Techniques 1(1): 27-37 (2007)
	2005
2		Erik Larsson, Stina Edbom: Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint. VLSI-SoC 2005: 221-244
	2004
1		Stina Edbom, Erik Larsson: An Integrated Technique for Test Vector Selection and Test Scheduling under Test Time Constraint. Asian Test Symposium 2004: 254-257

Coauthor Index

1 Erik Larsson [1] [2] [3]

Last update Tue May 29 20:41:18 2012 CET by the DBLP Team —

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