Kevin R. Eckersall

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1997

3 S. Yu, B. W. Jervis, Kevin R. Eckersall, Ian M. Bell: Diagnosis of CMOS op-amps with gate oxide short faults using multilayer perceptrons. IEEE Trans. on CAD of Integrated Circuits and Systems 16(8): 930-935 (1997)

1995

2 Ian M. Bell, Kevin R. Eckersall, Stephen J. Spinks, Gaynor E. Taylor: Fault Orientated Test and Fault Simulation of Mixed Signal Integrated Circuits. ISCAS 1995: 389-392

1 Geir E. Sæther, Chris Toumazou, Gaynor E. Taylor, Kevin R. Eckersall, Ian M. Bell: Concurrent Self Test of Switched Current Circuits Based on the S²I-Technique. ISCAS 1995: 841-844

	1997
3		S. Yu, B. W. Jervis, Kevin R. Eckersall, Ian M. Bell: Diagnosis of CMOS op-amps with gate oxide short faults using multilayer perceptrons. IEEE Trans. on CAD of Integrated Circuits and Systems 16(8): 930-935 (1997)
	1995
2		Ian M. Bell, Kevin R. Eckersall, Stephen J. Spinks, Gaynor E. Taylor: Fault Orientated Test and Fault Simulation of Mixed Signal Integrated Circuits. ISCAS 1995: 389-392
1		Geir E. Sæther, Chris Toumazou, Gaynor E. Taylor, Kevin R. Eckersall, Ian M. Bell: Concurrent Self Test of Switched Current Circuits Based on the S²I-Technique. ISCAS 1995: 841-844

Coauthor Index

Last update Tue May 29 20:41:18 2012 CET by the DBLP Team —

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1	Ian M. Bell	[1] [2] [3]
2	B. W. Jervis	[3]
3	Geir E. Sæther	[1]
4	Stephen J. Spinks	[2]
5	Gaynor E. Taylor	[1] [2]
6	Christofer Toumazou (Chris Toumazou)	[1]
7	S. Yu	[3]