Jennifer Dworak

	2012
31		Elif Alpaslan, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Jennifer Dworak: NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test. IEEE Trans. on CAD of Integrated Circuits and Systems 31(5): 809-813 (2012)
	2011
30		Nuno Alves, Y. Shi, N. Imbriglia, Jennifer Dworak, Kundan Nepal, R. Iris Bahar: Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis. European Test Symposium 2011: 211
29		Yiwen Shi, Kantapon Kaewtip, Wan-Chan Hu, Jennifer Dworak: Partial state monitoring for fault detection estimation. ITC 2011: 1-10
28		Nuno Alves, Yiwen Shi, Jennifer Dworak, R. Iris Bahar, Kundan Nepal: Enhancing online error detection through area-efficient multi-site implications. VTS 2011: 241-246
	2010
27		Nuno Alves, Kundan Nepal, Jennifer Dworak, R. Iris Bahar: Improving the testability and reliability of sequential circuits with invariant logic. ACM Great Lakes Symposium on VLSI 2010: 131-134
26		Elif Alpaslan, Jennifer Dworak, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Paul van de Wiel: NIM- a noise index model to estimate delay discrepancies between silicon and simulation. DATE 2010: 1373-1376
25		Yiwen Shi, Wan-Chan Hu, Jennifer Dworak: Too many faults, too little time on creating test sets for enhanced detection of highly critical faults and defects. VTS 2010: 319-324
24		Nuno Alves, Alison Buben, Kundan Nepal, Jennifer Dworak, R. Iris Bahar: A Cost Effective Approach for Online Error Detection Using Invariant Relationships. IEEE Trans. on CAD of Integrated Circuits and Systems 29(5): 788-801 (2010)
23		Elif Alpaslan, Yu Huang, Xijiang Lin, Wu-Tung Cheng, Jennifer Dworak: On Reducing Scan Shift Activity at RTL. IEEE Trans. on CAD of Integrated Circuits and Systems 29(7): 1110-1120 (2010)
	2009
22		Nuno Alves, Kundan Nepal, Jennifer Dworak, R. Iris Bahar: Detecting errors using multi-cycle invariance information. DATE 2009: 791-796
21		Nuno Alves, Jennifer Dworak, R. Iris Bahar, Kundan Nepal: Compacting test vector sets via strategic use of implications. ICCAD 2009: 83-88
	2008
20		Yiwen Shi, Kellie DiPalma, Jennifer Dworak: Efficient Determination of Fault Criticality for Manufacturing Test Set Optimization. DFT 2008: 403-411
19		Kundan Nepal, Nuno Alves, Jennifer Dworak, R. Iris Bahar: Using Implications for Online Error Detection. ITC 2008: 1-10
18		Elif Alpaslan, Yu Huang, Xijiang Lin, Wu-Tung Cheng, Jennifer Dworak: Reducing Scan Shift Power at RTL. VTS 2008: 139-146
	2007
17		Jennifer Dworak: Which defects are most critical? optimizing test sets to minimize failures due to test escapes. ITC 2007: 1-10
16		Jennifer Dworak: An Analysis of Defect Detection for Weighted Random Patterns Generated with Observation/Excitation-Aware Partial Fault Targeting. VTS 2007: 205-210
	2006
15		Vladimir Stojanovic, R. Iris Bahar, Jennifer Dworak, Richard Weiss: A cost-effective implementation of an ECC-protected instruction queue for out-of-order microprocessors. DAC 2006: 705-708
	2005
14		Jennifer Dworak: An Investigation of Excitation Balance and Additional Mandatory Conditions for the Diagnosis of Fortuitously Detected Defects. MTV 2005: 48-54
	2004
13		Jennifer Dworak, Brad Cobb, James Wingfield, M. Ray Mercer: Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects. DATE 2004: 1066-1071
12		Jennifer Dworak, James Wingfield, M. Ray Mercer: A Preliminary Investigation of Observation Diversity for Enhancing Fortuitous Detection of Defects. DFT 2004: 460-468
11		Jennifer Dworak, David Dorsey, Amy Wang, M. Ray Mercer: Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets. VTS 2004: 9-15
	2003
10		James Wingfield, Jennifer Dworak, M. Ray Mercer: Function-Based Dynamic Compaction and its Impact on Test Set Sizes. DFT 2003: 167-174
	2002
9		Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams: Enhancing test efficiency for delay fault testing using multiple-clocked schemes. DAC 2002: 371-374
8		Sooryong Lee, Brad Cobb, Jennifer Dworak, Michael R. Grimaila, M. Ray Mercer: A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults. DATE 2002: 94-99
7		Jennifer Dworak, James Wingfield, Brad Cobb, Sooryong Lee, Li-C. Wang, M. Ray Mercer: Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults. DFT 2002: 177-185
6		Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams: Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme. ITC 2002: 407-416
	2001
5		Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang: Defect-Oriented Testing and Defective-Part-Level Prediction. IEEE Design & Test of Computers 18(1): 31-41 (2001)
	2000
4		Jennifer Dworak, Michael R. Grimaila, Brad Cobb, Ting-Chi Wang, Li-C. Wang, M. Ray Mercer: On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction. Asian Test Symposium 2000: 151-
3		Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer: Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D. ITC 2000: 930-939
	1999
2		Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer: Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies. ITC 1999: 1031-1037
1		Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer: REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. VTS 1999: 268-274

Coauthor Index

1	Elif Alpaslan	[18] [23] [26] [31]
2	Nuno Alves	[19] [21] [22] [24] [27] [28] [30]
3	R. Iris Bahar	[15] [19] [21] [22] [24] [27] [28] [30]
4	Hari Balachandran	[1]
5	Alison Buben	[24]
6	Kenneth M. Butler	[1] [5]
7	Kwang-Ting Cheng (Kwang-Ting (Tim) Cheng)	[6] [9]
8	Wu-Tung Cheng	[18] [23]
9	Brad Cobb	[4] [7] [8] [13]
10	Kellie DiPalma	[20]
11	David Dorsey	[11]
12	Michael R. Grimaila	[1] [2] [3] [4] [5] [8]
13	Wilmar M. Heuvelman	[26] [31]
14	Bryan Houchins	[1]
15	Wan-Chan Hu	[25] [29]
16	Yu Huang	[18] [23]
17	N. Imbriglia	[30]
18	Kantapon Kaewtip	[29]
19	Rohit Kapur	[6] [9]
20	Bram Kruseman	[26] [31]
21	Sooryong Lee	[1] [2] [3] [5] [7] [8]
22	Xijiang Lin	[18] [23]
23	Jing-Jia Liou	[6] [9]
24	Ananta K. Majhi	[26] [31]
25	Vineet Mathur	[1]
26	M. Ray Mercer	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13]
27	Kundan Nepal	[19] [21] [22] [24] [27] [28] [30]
28	Jaehong Park	[1]
29	Y. Shi	[30]
30	Yiwen Shi	[20] [25] [28] [29]
31	Bret Stewart	[1] [5]
32	Vladimir Stojanovic	[15]
33	Amy Wang	[11]
34	Li-C. Wang	[1] [2] [3] [4] [5] [6] [7] [9]
35	Ting-Chi Wang	[4]
36	Richard Weiss	[15]
37	Jason D. Wicker	[5]
38	Paul van de Wiel (Paul J. A. M. van de Wiel)	[26]
39	Thomas W. Williams	[6] [9]
40	James Wingfield	[7] [10] [12] [13]

Colors in the list of coauthors

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