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- CSB - MetaPress - Google - Bing - Yahoo
 | 2005 | |
|---|---|---|
| 2 |      | G. Boselli, C. Duvvury: Trends and challenges to ESD and Latch-up designs for nanometer CMOS technologies. Microelectronics Reliability 45(9-11): 1406-1414 (2005) |
| 2001 | ||
| 1 | | S. Voldman, W. Anderson, R. Ashton, M. Chaine, C. Duvvury, T. Maloney, E. Worley: A strategy for characterization and evaluation of ESD robustness of CMOS semiconductor technologies. Microelectronics Reliability 41(3): 335-348 (2001) |
| 1 | W. Anderson | [1] |
| 2 | R. Ashton | [1] |
| 3 | G. Boselli | [2] |
| 4 | M. Chaine | [1] |
| 5 | T. Maloney | [1] |
| 6 | S. Voldman | [1] |
| 7 | E. Worley | [1] |
Colors in the list of coauthors
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