Rainer Duschl

	2007
3		Rainer Duschl, M. Kerber, A. Avellan, S. Jakschik, U. Schroeder, S. Kudelka: Reliability aspects of Hf-based capacitors: Breakdown and trapping effects. Microelectronics Reliability 47(4-5): 497-500 (2007)
	2005
2		Rainer Duschl, Rolf-Peter Vollertsen: Is the power-law model applicable beyond the direct tunneling regime? Microelectronics Reliability 45(12): 1861-1867 (2005)
	2001
1		Werner Prost, U. Auer, Franz-Josef Tegude, Christian Pacha, Karl Goser, Rainer Duschl, K. Eberl, O. Schmidt: Tunnelling Diode Technology. ISMVL 2001: 49-

Coauthor Index

1	U. Auer	[1]
2	A. Avellan	[3]
3	K. Eberl	[1]
4	Karl Goser	[1]
5	S. Jakschik	[3]
6	M. Kerber	[3]
7	S. Kudelka	[3]
8	Christian Pacha	[1]
9	Werner Prost	[1]
10	O. Schmidt	[1]
11	U. Schroeder	[3]
12	Franz-Josef Tegude	[1]
13	Rolf-Peter Vollertsen	[2]

Colors in the list of coauthors

Last update Tue May 29 20:41:18 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page