R. Duschl

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2005

1 G. Neumann, J. Touzel, R. Duschl: Localization and physical analysis of dielectric weaknesses for state-of-the-art deep trench based DRAM products. Microelectronics Reliability 45(9-11): 1520-1525 (2005)

	2005
1		G. Neumann, J. Touzel, R. Duschl: Localization and physical analysis of dielectric weaknesses for state-of-the-art deep trench based DRAM products. Microelectronics Reliability 45(9-11): 1520-1525 (2005)

Coauthor Index

1 G. Neumann [1]

2 J. Touzel [1]

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