Sai Raghuram Durbha

	2009
4		Amit Laknaur, Rui Xiao, Sai Raghuram Durbha, Haibo Wang: Design of a window comparator with adaptive error threshold for online testing applications. Microelectronics Journal 40(9): 1257-1263 (2009)
	2007
3		Amit Laknaur, Rui Xiao, Sai Raghuram Durbha, Haibo Wang: Design of a Window Comparator with Adaptive Error Threshold for Online Testing Applications. ISQED 2007: 501-506
	2006
2		Sai Raghuram Durbha, Amit Laknaur, Haibo Wang: Investigating the Efficiency of Integrator-Based Capacitor Array Testing Techniques. VTS 2006: 320-325
1		Amit Laknaur, Sai Raghuram Durbha, Haibo Wang: Built-In-Self-Testing Techniques for Programmable Capacitor Arrays. J. Electronic Testing 22(4-6): 449-462 (2006)

Coauthor Index

1	Amit Laknaur	[1] [2] [3] [4]
2	Haibo Wang	[1] [2] [3] [4]
3	Rui Xiao	[3] [4]

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