Ph. Dupuy

	2010
4		D. Martineau, T. Mazeaud, M. Legros, Ph. Dupuy, C. Levade: Characterization of alterations on power MOSFET devices under extreme electro-thermal fatigue. Microelectronics Reliability 50(9-11): 1768-1772 (2010)
	2009
3		D. Martineau, T. Mazeaud, M. Legros, Ph. Dupuy, C. Levade, G. Vanderschaeve: Characterization of ageing failures on power MOSFET devices by electron and ion microscopies. Microelectronics Reliability 49(9-11): 1330-1333 (2009)
	2007
2		B. Khong, M. Legros, P. Tounsi, Ph. Dupuy, X. Chauffleur, C. Levade, G. Vanderschaeve, E. Scheid: Characterization and modelling of ageing failures on power MOSFET devices. Microelectronics Reliability 47(9-11): 1735-1740 (2007)
	2005
1		B. Khong, P. Tounsi, Ph. Dupuy, X. Chauffleur, M. Legros, A. Deram, C. Levade, G. Vanderschaeve, J. M. Dorkel, J. P. Fradin: Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue. Microelectronics Reliability 45(9-11): 1717-1722 (2005)

Coauthor Index

1	X. Chauffleur	[1] [2]
2	A. Deram	[1]
3	J. M. Dorkel	[1]
4	J. P. Fradin	[1]
5	B. Khong	[1] [2]
6	M. Legros	[1] [2] [3] [4]
7	C. Levade	[1] [2] [3] [4]
8	D. Martineau	[3] [4]
9	T. Mazeaud	[3] [4]
10	E. Scheid	[2]
11	P. Tounsi	[1] [2]
12	G. Vanderschaeve	[1] [2] [3]

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