Jean-Yves Dupuy

	2011
2		S. Ghosh, B. Grandchamp, G. A. Koné, François Marc, C. Maneux, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean-Yves Dupuy, Jean Godin: Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design. Microelectronics Reliability 51(9-11): 1736-1741 (2011)
	2009
1		Nils Weimann, Vincent Houtsma, Rose Kopf, Yves Baeyens, Joseph Weiner, Alaric Tate, John Frackoviak, Young-Kai Chen, Gregory Raybon, Jean Godin, Muriel Riet, Virginie Nodjiadjim, Agnieszka Konczykowska, Jean-Yves Dupuy, Filipe Jorge, André Scavennec, Gabriel Charlet: InP DHBT circuits: From device physics to 40Gb/s and 100Gb/s transmission system experiments. Bell Labs Technical Journal 14(3): 43-62 (2009)

Coauthor Index

1	Yves Baeyens	[1]
2	Gabriel Charlet	[1]
3	Young-Kai Chen	[1]
4	John Frackoviak	[1]
5	S. Ghosh	[2]
6	Jean Godin	[1] [2]
7	B. Grandchamp	[2]
8	Vincent Houtsma	[1]
9	Filipe Jorge	[1]
10	Agnieszka Konczykowska	[1]
11	G. A. Koné	[2]
12	Rose Kopf	[1]
13	C. Maneux (Cristell Maneux)	[2]
14	François Marc	[2]
15	Virginie Nodjiadjim	[1] [2]
16	Gregory Raybon	[1]
17	Muriel Riet	[1] [2]
18	André Scavennec	[1]
19	Alaric Tate	[1]
20	Nils Weimann	[1]
21	Joseph Weiner	[1]
22	Thomas Zimmer	[2]

Last update Tue May 29 20:41:18 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page